\u3000\u30 Beijing Jingyeda Technology Co.Ltd(003005) 67 Wuhan Jingce Electronic Group Co.Ltd(300567) )
The Shanghai WeChat precision test semiconductor official account was released by the subsidiary company. The two BFI100 units were selected for the Ming Chang inspection this week. The equipment is mainly used for 65nm-180nm semiconductor production line monitoring. The first equipment will be launched in October this year.
Key points supporting rating
Bright field detection is generally used for defect detection of patterned wafers. Through high-quality optical imaging, bright field detection detects defects whose size is far less than the optical diffraction limit. It has high requirements for the processing and installation accuracy of optical lens, motion control accuracy, brightness of lighting source, suppression of image acquisition noise, data processing ability and so on. It is often close to the harsh technical requirements of lithography machines with the same process nodes. In contrast, the dark field detection equipment realizes detection by detecting the light scattering signal of defects, which is easier to obtain sufficient signal-to-noise ratio. Its technical difficulty and system complexity are less than that of the bright field equipment. Therefore, the price of the bright field equipment is often much higher than that of the dark field equipment on the same production line.
The launch of new products of Mingchang testing broke the competition pattern monopolized by KLA and applied materials. As the necessary main equipment for semiconductor front-end detection, the core technology of bright field detection has been monopolized by several foreign companies. According to Gartner data, KLA has a market share of 72% in the field of patterned wafer detection. As the first mass-produced bright field testing equipment in China, Jingji micro bfi100 will help customers obtain more cost-effective equipment selection and application services in this field.
Jingji micro will promote the product iteration of bright field detection. Bfi100 bright field detection equipment uses ultraviolet band illumination and visible band illumination, and its detection sensitivity exceeds the optical diffraction limit. It can be widely used in the detection of key defects in key processes of chip manufacturing, such as photoresist bridging after lithography, such as logic device (logic), power device, Si OLED, DRAM, 2D NAND, etc, Key defects such as short circuit and disconnection of metal wiring after etching. With the launch of bfi100, Shanghai Jingji micro will make greater efforts to research and develop the key components and complete system of the open field detection equipment bfi200 for 28nm process nodes, and strive to achieve the research and development goal of open field detection equipment for higher process nodes as soon as possible.
Shanghai Precision Measurement semiconductor product layout leads the localization of semiconductor measurement equipment. According to the market layout, the company will launch three times of the new beam testing equipment in the market, and the new beam testing equipment will also account for three times of the market. Compared with measurement enterprises in Nanjing, China, such as Zhong'an, Essien semiconductor, Ruili, Dongfang wafer, and zhongkefei measurement, Shanghai Precision Measurement semiconductor currently has more product types and obtains some batch repeat orders.
Profit forecast and rating
In view of the significant progress of the company's new product launch and new customer expansion, it is predicted that the net profit in 21-23 years will be RMB 268 / 326 / 376 million, maintaining the buy rating.
Main risks of rating
The uncertainty of international geopolitical friction and the shortage of parts lead to the delay of order delivery.
